Tootfinder

Pretty shocking 18 minutes Lawrence O'Donnell about the emptyness of Trump and the results.
Lawrence O'Donnell: What you're feeling is the banality of cruelty from Trump and the Republican Party
https://www.msnbc.com/opinion/msnbc-opinio

Magnetic force microscopy versus scanning quantum-vortex microscopy: Probing pinning landscape in granular niobium films
A. Yu. Aladyshkin, R. A. Hovhannisyan, S. Yu. Grebenchuk, S. A. Larionov, A. G. Shishkin, O. V. Skryabina, A. V. Samokhvalov, A. S. Mel'nikov, D. Roditchev, V. S. Stolyarov
https://arxiv.org/abs/2507.05172…

Magnetic force microscopy versus scanning quantum-vortex microscopy: Probing pinning landscape in granular niobium films
We provide an overview of the methodology and fundamental principles associated with newly developed experimental technique -- scanning quantum-vortex microscopy [Hovhannisyan et al., Commun. Mater., vol. 6, 42 (2025)]. This approach appears promising for experimental studies of vortex pinning phenomena in superconducting films and nanodevices. In particular, we studied the magnetic properties of magnetron-sputtered niobium (Nb) films by low-temperature magnetic force microscopy. As the tempera…

Flux Trapping Characterization for Superconducting Electronics Using a Cryogenic Widefield NV-Diamond Microscope
Rohan T. Kapur, Pauli Kehayias, Sergey K. Tolpygo, Adam A. Libson, George Haldeman, Collin N. Muniz, Alex Wynn, Nathaniel J. O'Connor, Neel A. Parmar, Ryan Johnson, Andrew C. Maccabe, John Cummings, Justin L. Mallek, Danielle A. Braje, Jennifer M. Schloss

Flux Trapping Characterization for Superconducting Electronics Using a Cryogenic Widefield NV-Diamond Microscope
Magnetic flux trapping is a significant hurdle limiting reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micron-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~μ$m strip…