Tootfinder

Si(100)-SiO$_2$ Trap Density Dependence on Sample Processing
Adam J. Czarnecki, Nikola L. Kolev, Patrick See, Nick Sullivan, Wyatt A. Behn, Neil J. Curson, Taylor J. Z. Stock, Peter Gr\"utter
https://arxiv.org/abs/2505.23574

Si(100)-SiO$_2$ Trap Density Dependence on Sample Processing
As silicon-based devices continue to shrink to the nanoscale, traps at the Si-SiO$_2$ interface pose increasing challenges to device performance. These traps reduce channel carrier mobility and shift threshold voltages in integrated circuits, and introduce charge noise in quantum systems, reducing their coherence times. Knowledge of the precise location of such traps aids in understanding their influence on device performance. In this work, we demonstrate that frequency-modulated atomic force m…

Editors at Jeff Bezos’s
@… were even more dismissive of the #handsoff pro-democracy movement on 4/6.
More than 1 million Americans expressing their concerns got a tiny box.
The next day, WaPo editors chose to devote half the #FrontPage to a personal achievement - a new hockey scoring leader.
A Putin-supporter who plays in the NHL.
#WaPo
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