Tootfinder

Bridging Grain Mapping and Dark Field X-ray Microscopy for Multiscale Diffraction Imaging
Aditya Shukla, Can Yildirim, James A. D. Ball, Carsten Detlefs, Adam A. W. Cretton, Marilyn Sarkis, Michela La Bella, Wolfgang Ludwig, Yubin Zhang, Nils Axel Henningsson
https://arxiv.org/abs/2508.17897

Bridging Grain Mapping and Dark Field X-ray Microscopy for Multiscale Diffraction Imaging
Resolving how defects emerge and interact within the hierarchical structure of polycrystalline materials remains a core challenge in materials science. Grain-mapping methods such as three-dimensional X-ray diffraction (3DXRD) and diffraction contrast tomography (DCT) provide essential mesoscale context but lack the resolution to image lattice defects. Conversely, high-resolution methods like Dark Field X-ray Microscopy (DFXM) capture lattice distortions but not the surrounding microstructure. H…