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Multi-angle precession electron diffraction (MAPED): a versatile approach to 4D-STEM precession
Stephanie M. Ribet, Rohan Dhall, Colin Ophus, Karen C. Bustillo
https://arxiv.org/abs/2506.11327

Multi-angle precession electron diffraction (MAPED): a versatile approach to 4D-STEM precession
Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems, where automatic alignments lead to fast, high-quality results. The dependence of these experiments on specific hardware and software is evident even when switching to non-integrated detectors on a precession tool, as experimental set-up becomes challenging an…