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A Structural Causal Model for Electronic Device Reliability: From Effects to Counterfactuals
Federico Mattia Stefanini (Department of Environmental Science and Policy, University of Milan, Via Celoria 2, 20133 Milan, Italy), Nedka Dechkova Nikiforova (Department of Statistics Computer Science Applications 'G. Parenti', University of Florence, viale Morgagni 59, Florence, 50134 Florence, Italy), Rossella Berni (Department of Statistics Computer Science Applications 'G. Paren…

A Structural Causal Model for Electronic Device Reliability: From Effects to Counterfactuals
Electronic devices exhibit changes in electrical resistance over time at varying rates, depending on the configuration of certain components. Since measuring overall electrical resistance requires partial disassembly, only a limited number of measurements are performed over thousands of operating hours. This leads to censored failure times, whether under natural stress or under accelerated stress conditions. To address these challenges, including device-specific failure thresholds, a parametric…