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New insights into the origin of the first sharp diffraction peak in amorphous silica from an analysis of chemical and radial ordering
Parthapratim Biswas, Devilal Dahal, Stephen R. Elliott
https://arxiv.org/abs/2403.10632

New insights into the origin of the first sharp diffraction peak in amorphous silica from an analysis of chemical and radial ordering
The structural origin of the first sharp diffraction peak (FSDP) in amorphous silica is studied by analyzing chemical and radial ordering of silicon (Si) and oxygen (O) atoms in binary amorphous networks. The study shows that the chemical order involving Si--O and O--O pairs play a major role in the formation of the FSDP in amorphous silica. This is supplemented by small contributions arising from the relatively weak Si--Si correlations in the Fourier space. A shell-by-shell analysis of the rad…