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Bias Corrected Variance Stabilizing Transformation for Small Area Estimation
Masayo Y. Hirose, Malay Ghosh, Mayumi Oka
https://arxiv.org/abs/2507.04583 htt…

Bias Corrected Variance Stabilizing Transformation for Small Area Estimation
Small area estimation models are typically based on the normality assumption of response variables. More recently, attention has been drawn to the transformation of the original variables to justify the assumption of normality. Variance stabilizing transformation of observation serves the dual purpose of reaching closer to normality, as well as known variance of the transformed variables in contrast to the assumption of known variances of the original variables, the latter needed to avoid non-i…

Where does non-Universality in Assembly Bias come from?
Charuhas Shiveshwarkar, Marilena Loverde, Christopher M. Hirata, Drew Jamieson
https://arxiv.org/abs/2508.11798 https://

Where does non-Universality in Assembly Bias come from?
Constraints on local primordial non-Gaussianity (LPnG) obtained from galaxy power spectra are limited by the perfect degeneracy between the LPnG parameter $f_{\rm NL}$ and the bias parameter $b_ϕ$ which encodes the response of galaxy clustering to a change in the amplitude of primordial curvature fluctuations. For galaxies observed by galaxy surveys, the relation between $b_ϕ$ and the galaxy bias $b_{g}$ is poorly understood and differs significantly from the universal mass function ansatz. I…

First-Principles Nanocapacitor Simulations of the Optical Dielectric Constant in Water Ice
Anthony Mannino, Graciele M. Arvelos, Kedarsh Kaushik, Emilio Artacho, Pablo Ordejon, Alexandre R. Rocha, Luana S. Pedroza, Marivi Fern\'andez-Serra
https://arxiv.org/abs/2506.23003

First-Principles Nanocapacitor Simulations of the Optical Dielectric Constant in Water Ice
We introduce a combined density functional theory (DFT) and non-equilibrium Green's function (NEGF) framework to compute the capacitance of nanocapacitors and directly extract the dielectric response of a sub-nanometer dielectric under bias. We identify that at the nanoscale conventional capacitance evaluations based on stored charge per unit voltage suffer from an ill-posed partitioning of electrode and dielectric charge. This partitioning directly impacts the geometric definition of capacitan…