Tootfinder

FAULT PROBE: A Generic Rowhammer-based Bit Recovery Attack
Kemal Derya, M. Caner Tol, Berk Sunar
https://arxiv.org/abs/2406.06943 https://

FAULT+PROBE: A Generic Rowhammer-based Bit Recovery Attack
Rowhammer is a security vulnerability that allows unauthorized attackers to induce errors within DRAM cells. To prevent fault injections from escalating to successful attacks, a widely accepted mitigation is implementing fault checks on instructions and data. We challenge the validity of this assumption by examining the impact of the fault on the victim's functionality. Specifically, we illustrate that an attacker can construct a profile of the victim's memory based on the directional pattern…

Strong Repulsive Lifshitz-van der Waals Forces on Suspended Graphene
Gianluca Vagli, Tian Tian, Franzisca Naef, Hiroaki Jinno, Kemal Celebi, Elton J. G. Santos, Chih-Jen Shih
https://arxiv.org/abs/2406.07384

Strong Repulsive Lifshitz-van der Waals Forces on Suspended Graphene
Understanding surface forces of two-dimensional (2D) materials is of fundamental importance as they govern molecular dynamics and atomic deposition in nanoscale proximity. Despite recent observations in wetting transparency and remote epitaxy on substrate-supported graphene, very little is known about the many-body effects on their van der Waals (vdW) interactions, such as the role of surrounding vacuum in wettability of suspended 2D monolayers. Here we report on a stark repulsive Lifshitz-van …

Connecting physics to systems with modular spin-circuits
Kemal Selcuk, Saleh Bunaiyan, Nihal Sanjay Singh, Shehrin Sayed, Samiran Ganguly, Giovanni Finocchio, Supriyo Datta, Kerem Y. Camsari
https://arxiv.org/abs/2404.19345

Connecting physics to systems with modular spin-circuits
An emerging paradigm in modern electronics is that of CMOS + $\sf X$ requiring the integration of standard CMOS technology with novel materials and technologies denoted by $\sf X$. In this context, a crucial challenge is to develop accurate circuit models for $\sf X$ that are compatible with standard models for CMOS-based circuits and systems. In this perspective we present physics-based, experimentally benchmarked modular circuit models that can be used to evaluate a class of CMOS + $\sf X$ sy…