Tootfinder

Half-life determination of heavy ions in a storage ring considering feeding and depleting background processes
R. J. Chen, G. Leckenby, R. S. Sidhu, J. Glorius, M. S. Sanjari, Yu. A. Litvinov, F. C. Akinci, M. Bai, K. Blaum, F. Bosch, C. Brandau, T. Dickel, I. Dillmann, D. Dmytriiev, T. Faestermann, O. Forstner, B. Franczak, B. S. Gao, H. Geissel, R. Gernh\"auser, C. Griffin, A. Gumberidze, E. Haettner, R. He{\ss}, P. -M. Hillenbrand, P. Kienle, W. Korten, Ch. Kozhuharov, N. Kuzmi…

Half-life determination of heavy ions in a storage ring considering feeding and depleting background processes
Heavy-ion storage rings have relatively large momentum acceptance which allows for multiple ion species to circulate at the same time. This needs to be considered in radioactive decay measurements of highly charged ions, where atomic charge exchange reactions can significantly alter the intensities of parent and daughter ions. In this study, we investigate this effect using the decay curves of ion numbers in the recent $^{205}$Tl$^{81+}$ bound-state beta decay experiment conducted using the Exp…

This https://arxiv.org/abs/2402.11852 has been replaced.
initial toot: https://mastoxiv.page/@arXiv_mat…

Forcing techniques for Cichoń's Maximum: Lecture notes for the mini-course at the University of Vienna
Cichoń's diagram describes the connections between combinatorial notions related to measure, category, and compactness of sets of irrational numbers. In the second part of the 2010's, Goldstern, Kellner and Shelah constructed a forcing model of Cichoń's Maximum (meaning that all non-dependent cardinal characteristics are pairwise different) by using large cardinals. Some years later, we eliminated this large cardinal assumption. In this mini-course, we explore the forcing techniques to constr…

Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation
Sudipta Paria, Md Rezoan Ferdous, Aritra Dasgupta, Atri Chatterjee, Swarup Bhunia
https://arxiv.org/abs/2505.19418

Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation
Scan-based Design-for-Testability (DFT) measures are prevalent in modern digital integrated circuits to achieve high test quality at low hardware cost. With the advent of 3D heterogeneous integration and chiplet-based systems, the role of scan is becoming ever more important due to its ability to make internal design nodes controllable and observable in a systematic and scalable manner. However, the effectiveness of scan-based DFT suffers from poor testability of internal nodes for complex circ…